Learn More about Making Low Current Measurements

At Micromanipulator we not only sell state-of-the-art probe stations but have made it a priority to provide our customers with lots of useful information.  One of the areas we feel it is important to have more detailed information available for both beginners and experienced users is on making low current (femtoampere level) measurements with a probe station. 

 

In one of our application notes, we clearly go over the steps you need to consider for proper setup, shielding and guarding.  Our discussion includes many of the common problems users run into with low current probing and the best ways to solve them.  We also caution users to keep in mind that there are many factors that can adversely affect low level measurements.  By enumerating the most likely ones, system users will be better able to identify and minimize the noise source or the noise coupling mechanism and learn how to isolate noise from the signal.  

Furthermore, we discuss two typical probe contact configurations used in the grounding and shielding techniques for making low current measurements.  The first configuration is surface to surface, which is represented by MOSFET subthreshold measurements.  The second one we define is surface to substrate measurements that are represented by time dependent dielectric leakage observations (TDDL).  

We also go over the issue of cable isolation and noise.  Our team explains why femtoampere current measurements require very high resistive isolation and guarding between the signal path and all conductors at the reference potential.  In addition users will learn why it is important to keep their probe stations clean as well as the best models to use for low current probing - 8060, 8065 and the 8860.  We invite you to take a few minutes to read our complete application note on “Low Current Probing Basics.”

Micromanipulator not only invented analytical probing in 1956 but we remain the leading name in the field.  As such we reliably deliver the tools and life cycle support the semiconductor industry depends on.  We invite you to contact us to find out more about our wide range of probe stations, accessories and consumables.