Helpful Guidelines for Successful Low Level Measurements

Micromanipulator wants our customers to succeed, which is why we design high-quality products for a wide range of applications.  We also understand it is important to provide information on each product and to be available to answer our customers’ questions.  For technical details and troubleshooting, we offer a variety of pdfs and Application Notes.   

One of our Application Notes deals with “The Basics of Low Current Probing.”  Included in the comprehensive discussion are common problems users run into with low current probing, and suggestions for how to solve them.  The document summarizes a list of helpful guidelines for successful low level measurements. 

We start by reminding users to pay attention to details as the nature of the very small physical values being observed mean there are a variety of factors that can interfere with the desired measurements.  Micromanipulator’s experts recommend getting into the habit of reviewing and practicing preventive measures to eliminate problems before they occur. 

We also offer a tip on how to diagnose noise sources and to minimize their effects.  Since analog time domain measurement techniques are not readily available for direct observation at femtoampere levels, this can be challenging.  One of our suggestions is to use a parametric tester that is configured to provide a sampled sweep of current versus time with a constant source voltage. 

Another area we discuss is system grounds, shields and connections.  We provide a couple diagrams that show the ideal grounding, shielding and connection scheme for surface to surface and surface to substrate current measurements. 

You will also find information regarding exploit filtering and averaging available in the instrument.  We suggest parametric measurements such as subthreshold and TDDL that lend themselves to filtering and averaging.  In addition our guidelines handle topics such as guarding and settling time, cable isolation and noise, and cleanliness.  See our website to read the full report and to see our full line of high-quality probe stations and accessories. 

Micromanipulator not only invented analytical probing in 1956 but we are leaders in the field and reliably deliver the tools and life cycle support the semi-conductor industry depends on. Our company’s philosophy and what drives our success is an unfaltering commitment to our customers’ satisfaction. Please contact us to learn more about our wide range of probe stations and accessories.