Within our Application Notes, you will find discussions offering solutions to common application problems, and techniques to help you be more successful using Micromanipulator’s products. They include:
Micromanipulator Application Note – CV Probing
Micromanipulator Application Note – Identifying Low Current Probing Problems
Micromanipulator Application Note – LCR Measurements with 4284A
Micromanipulator Application Note – Low Current Probing Basics
Micromanipulator Application Note – LTE and Vibration Isolation Table Integration
Micromanipulator Application Note – Proven Techniques for Thermal Probing
If you have ran into problems with thermal probing, we recommend taking a look at the “Proven Techniques for Thermal Probing.” We provide expert advice on how to successfully use a hot stage for elevated temperature probing or CV Measurement. Micromanipulator’s engineers discuss frequent problems such as uncontrolled movement that can cause the probe to slide or jump off its contact. This can impact your data as it may cause movement of up to one mil at any location on a six or eight-inch wafer. By analyzing the cause and effect of these problems, we provide smart equipment solutions.
One important take-away from the Application Note it that “a little technique can go a long way” when probing all forms of small geometries; and “a little experimenting” will help you discover the best probing angle and/ or technique. Please visit our website to read more solutions to hot stage probing techniques. And remember, our engineers are happy to give you a hand with any problems.
Micromanipulator not only invented analytical probing in 1956 but we reliably deliver the tools and life cycle support the semiconductor industry depends on. Part of our company’s philosophy and what drives our success is an unfaltering commitment to customer satisfaction. Along with offering one of the best selections of wafer probe stations on the market today, we also offer all of the consumables, accessories and on-site support you need.
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