Learn More about Making Low Current Measurements

At Micromanipulator we not only sell state-of-the-art probe stations but have made it a priority to provide our customers with lots of useful information.  One of the areas we feel it is important to have more detailed information available for both beginners and experienced users is on making low current (femtoampere level) measurements with a probe station. 

 

In one of our application notes, we clearly go over the steps you need to consider for proper setup, shielding and guarding.  Our discussion includes many of the common problems users run into with low current probing and the best ways to solve them.  We also caution users to keep in mind that there are many factors that can adversely affect low level measurements.  By enumerating the most likely ones, system users will be better able to identify and minimize the noise source or the noise coupling mechanism and learn how to isolate noise from the signal.  

Furthermore, we discuss two typical probe contact configurations used in the grounding and shielding techniques for making low current measurements.  The first configuration is surface to surface, which is represented by MOSFET subthreshold measurements.  The second one we define is surface to substrate measurements that are represented by time dependent dielectric leakage observations (TDDL).  

We also go over the issue of cable isolation and noise.  Our team explains why femtoampere current measurements require very high resistive isolation and guarding between the signal path and all conductors at the reference potential.  In addition users will learn why it is important to keep their probe stations clean as well as the best models to use for low current probing - 8060, 8065 and the 8860.  We invite you to take a few minutes to read our complete application note on “Low Current Probing Basics.”

Micromanipulator not only invented analytical probing in 1956 but we remain the leading name in the field.  As such we reliably deliver the tools and life cycle support the semiconductor industry depends on.  We invite you to contact us to find out more about our wide range of probe stations, accessories and consumables.

Recommendations for Cleaning Probe Tips

At Micromanipulator, we are committed to offering our customers consumables and accessories that are as expertly designed, engineered and manufactured as our line of high-quality probe stations.  Moreover to satisfy our customers’ application needs and preferences, we have plenty of choices available.  One example is our extensive selection of probe holders and probe tips. 

 

We offer a line of disposable probe tips (needles) as well as probe holders and tips in a single unit such as our Model 44, which is ideal for high frequency, low level signal testing or cutting.  Our high conductance probe tips (HCT) are specifically manufactured to increase tip conductance and reduce the probe scrub needed by a factor of 5 or more. Our inventory also includes a variety of straight and bent style probe holders.

 

Micromanipulator provides instructions on cleaning probe tips for optimal performance.  For our tungsten, tungsten carbide, nickel tips, HCT tip and custom probe tips coated with platinum, we recommend removing deposit from the probe tip by rinsing it in deionized water and using compressed air to dry excess water from the tip.  To remove oxide deposits, dip the probe tip into a 1.0 solution of normal sodium hydroxide (NaOH) for a few seconds.  Follow by rinsing with deionized water and dry with compressed air.       

 

If you use our beryllium copper probe tips, we recommend removing deposits from the tip by rinsing in deionized water and using compressed air to dry.  To remove oxide deposits, we suggest washing the tip in a 10% w/w sodium carbonate solution (NA2CO3) and again rinse in deionized water; however, do not dry the tips!  Instead dip the tip into a 10% v/v nitric acid solution (HNO3) until a reaction occurs.  Do not allow the reaction to continue for more than a second and immediately rinse the tip in deionized water. Follow up by drying the excessive water with compressed air.  For more suggestions on cleaning your probe tips and probe holders, please see our website.

 

At Micromanipulator, we not only invented analytical probing in 1956 but are still the top name in the field.  From concept, to production, right through to maintenance, our exclusive Full Life-Cycle Support guarantees customers’ success with our high-tech tools.   Please contact us to learn more about our wide range of probe stations and accessories. 

A Used Probe Station Offers a Great Value

At Micromanipulator we offer the chance to purchase a used reliable high performance probe station for significant savings over the cost of a new one.  Many of these products are the ones we used to conduct demonstrations and come with the same factory warranties and full support as our new products. 

 

In addition since we offer an active product trade-in and upgrade program, you will find those tools for resale also.  Our third option to help you save money and still get the performance of a high-tech Micromanipulator tool is to purchase one of our refurnished units.  Again we stand behind all of these products, and they too come with our full support and performance guarantee. 

Tools currently available include:

• P300J
• P300A
• 4060
• 450PM

Check our website often for new listings.  If you do not see what you need, give us a call as there may be a chance we can find one for you. 

 

As a customer of a used Micromanipulator probe station, you will get the benefit of our worldwide network of service support engineers who provide “system level” support on everything from optics to thermal chucks.    

 

Our preventative maintenance programs, extended warranties, and upgrade paths (even for obsolete tools!) ensure your investment is protected.  By combining close to 60 years of analytical probing experience with state-of-the-art design, we have the capability to provide customers with the best probe stations, accessories and consumables on the market.

 

Micromanipulator not only invented analytical probing in 1956 but we remain the leading name in the field.  As such we reliably deliver the tools and life cycle support the semiconductor industry depends on.  As part of our company’s philosophy and what drives our success is an unfaltering commitment to customers’ satisfaction.  We invite you to contact us to find out more about our wide range of probe stations and accessories.

Wafer Chucks Suited to Virtually Any Application or Budget

One of the things we do best at Micromanipulator is to listen to our customers and then design products to fit those needs.  One example is how we were the first ones in the industry to pioneer the integration of hot chuck systems with probe stations.  Continuing in that tradition, we are still the leading designers, engineers and manufacturers of wafer chucks that offer the broadest temperature range and the most advanced, non-operator dependent performance on the market today. 

 

Micromanipulator’s hot chuck systems support wafer testing from -65 to 400 degrees and offer features such as rapid heat up and cool down as well as minimizing expansion into the probes.  Our chucks maintain remarkable planarity over temperature changes with our Frictionless Kinematic Mount, and minimize heat radiation into the stage to prolong prober life.   Available in a choice of heating power supplies, we recommend an AC heating supply if you require fast heating without the need for chuck noise in the femtoamp level. To achieve the very lowest noise levels, go with our DC heating supply. 

 

Micromanipulator’s H1000 series thermal chucks are available in a range of configurations and provide the best planarity and the lowest noise to meet the needs of a variety of probing applications and budgets.  For users looking for the most economical cooling solution for above ambient testing conditions, our C1000 simple heat exchanger (HE) option is a great choice.  The chuck offers rapid cooling once the heat cycle is finished. 

 

Our C1000 zero degree cooling option offers the benefit of testing to zero degrees and provides optimal performance at holding temperatures at room ambient temperatures.  For applications requiring a wafer chuck to handle testing in temperatures as low as -65 degrees C, we offer our high-performance HC1000 cooling system.  All of Micromanipulator’s wafer chucks are capable of supporting 150 to 300 mm wafers in coaxial or triaxial configurations. 

 

At Micromanipulator, we not only invented analytical probing in 1956 but are still the top name in the field.  From concept, to production, right through to maintenance, our exclusive Full Life-Cycle Support guarantees customers’ success with our high-tech tools.   Please contact us to learn more about our wide range of probe stations and accessories. 

      

Innovative Application Board Probe Station

Designed with above and below ambient temperature capabilities, Micromanipulator’s 2210-LS system level probe station is our newest offering in an extensive line-up of high-quality probe stations.  Up until the development of the 2210-LS, most application boards were not appropriate for in-circuit e-test using traditional mechanical probing techniques.  Now however, by combining a traditional wafer probe to the device exercising capabilities of an application board, the 2210-LS system is designed to assist development teams working with post tape-out product spins. 

 

The new system offers extensive application coverage including basic DC, to E and K-Band analysis, and incorporating application boards for system level testing significantly expedites the failure analysis operation.  The 2210-LS also offers the benefit of comprehensive accessory support and flexible setups as well as temperature and ambient versions that all go into making it the perfect choice for many applications. 

 

Loaded with features such as an open, stable platform, it allows for high magnification sample viewing and probing.  In addition we have a 30” x 36” optical vibration isolation table that accommodates application boards measuring approximately 26” square, and two independently moveable stainless steel platens that accommodate up to 10 individual probe positioners. 

 

The system provides users with an opportunity to probe at the application board block or at system level while exercising their chip in mission mode.  This makes it easy to trace and analyze issues that manifest exclusively in the actual end application environment such as power, race conditions and clock domain. 

  

At Micromanipulator, we also design a range of excellent options for the system level probe station including removable ambient and thermal chucks for wafer level probing needs. Other options include stereo zoom and compound microscopes, a choice of CCD and video monitors and a shroud enclosure for light shielding.  See our website for more details on our revolutionary 2210-LS application board probe station.   

 

Micromanipulator not only invented analytical probing in 1956 but we remain the leading name in the field.  As such we reliably deliver the tools and life cycle support the semiconductor industry depends on.  We invite you to contact us to find out more about our wide range of probe stations, accessories and consumables.

Our Customized Approach Allows You to Meet Every Need!

As one of the top test probe manufacturers in the world, Micromanipulator is proud to be at the forefront of providing the semiconductor industry the advanced tools they need for applications ranging from low current to high speed testing.  The many areas we specialize in include failure analysis, high and low temperature characterization, device reliability analysis, low current/low noise measurement, ESD wafer level testing, high speed digital analysis, and more. 

 

One of the things that set us apart from our competitors is that we take a highly customized approach to designing, engineering and manufacturing our line of exceptional probe stations.  When you browse through our extensive selection, you will see we offer a variety of models intended to meet virtually any application need as well as price range.  We offer a choice of Specialty, Semi-automatic, High-performance, General-purpose Manual, and Economy Manual stations.

 

Furthermore, once you decide on the best station for you needs, you can then outfit it with some of our well-designed, and in some cases exclusive, accessories.  An example of one of these products is our H1000 series thermal wafer chuck, which offers our customers the lowest cost of ownership on the market.  The H1000 series also leads the industry with the best planarity and the lowest noise.

 

Another product that Micromanipulator is proud to offer our customers is a complete line of probe holders.  Designed for applications including general purpose DC characterization, high speed, wide bandwidth, low current and high power, customers can select a holder according to their application demands, personal preference, and measurement equipment interface requirements.  In addition as with most of our products, you will be able to find one that best fits your price range.  See our website for more information. 

 

At Micromanipulator, we not only invented analytical probing in 1956 but are still the top name in the field.  As such we reliably deliver the tools and life cycle support the semiconductor industry depends on.    Please contact us to learn more about our wide range of probe stations and accessories. 

Our Rigid Mount Light Tight Enclosure Assembly

At Micromanipulator we not only offer customers a wide selection of probe stations, but also an extensive line of technologically advanced options.  As part of our “systems approach,” to integration, we design products to meet many of the challenges faced by system users such as providing an environment that blocks out light and addresses vibration.

 

One innovative product that adeptly solves this problem is our Rigid Mount Light Tight Enclosure.  The unique unit offers users the benefit of having their probe station supported on a vibration isolated surface while enabling a light tight enclosure (LTE) to be mounted on the rigid surface of the vibration isolation table’s guard rails.  The enclosure creates a very stable environment and even when the doors of the LTE are opened, the floating vibration isolated surface is not disturbed. 

 

Another advantage to our Rigid Mount Light Tight Enclosure assembly is that it makes it easier to both install and remove a probe station.  The LTE is designed with access holes in the bottom plate that are outfitted with rubber “light shielding boots.”  These boots fit snugly around the inner table legs in order to prevent any light from leaking through the holes.  

 

Your Micromanipulator probe station will sit on the inner platform of the LTE, which rests on the vibration isolated surface.  To keep out light, the extended legs of the inner table protrude through the bottom of the LTE and are surrounded by the light shielding boots. 

 

This is just one example of how our technological approach helps to ensure our customers can focus on their data and not on the prober.  Please refer to ourwebsite to learn more about our many innovative products. 

 

Micromanipulator not only invented analytical probing in 1956 but we remain the leading name in the field.  As such we reliably deliver the tools and life cycle support the semiconductor industry depends on.  We invite you to contact us to find out more about our wide range of probe stations, accessories and consumables.