It is generally used to detect mobile ion contamination in oxide, and in particular very mobile sodium ion; and the technique requires varying the voltage in order to measure the capacitance. A challenge of C-V measurement has been to design a device that not only passes manufacturers’ testing in a controlled environment but one that can also handle the migration of sodium ions within the device while in the field. We know the failure to achieve this causes a multitude of problems including changing the parameters of the electrical performance, affecting the timing, and source and sink currents as well as the threshold voltages.
Thus the team at Micromanipulator has been addressing these problems for almost 50 years and offers our customers tools specifically designed to obtain quality test results. Our turnkey solution starts with several probe stations that provide the foundation for a highly accurate test environment for C-V measurements. C-V operators will also be interested in our exclusive H1000 series thermal wafer chuck, which leads the industry for the best planarity, lowest noise, and lowest cost of ownership. The H1000 has the ability to support wafer testing from temperature ranges of –65 degrees C to 400 degrees C, and protects the station from the heat that is radiated down the body.
If you perform C-V measurements, take a look at our LTE (light tight enclosure), which rests on the anti-vibration isolation table and completely encompasses the test station or the integrated shielded environment. Please contact your local representative or the team at Micromanipulator directly for additional information on our quality C-V solutions.
At Micromanipulator, we not only invented analytical probing in 1956 but are still the top name in the field. As such we reliably deliver the tools and life cycle support the semiconductor industry depends on. A key part of our company’s philosophy and what drives our success is an unfaltering commitment to customers’ satisfaction. Please contact us to learn more about our wide range of wafer probe stations and accessories.
No comments:
Post a Comment